PATTERN RECOGNITION LETTERS

       Special Issue on Pattern Recognition in Remote Sensing

               Submission Deadline: February 15, 2009

A Special Issue of the Pattern Recognition Letters journal
(http://www.elsevier.com/locate/inca/505619) in the combined fields of
pattern recognition and remote sensing will accept full journal papers
up to February 15, 2009.

The objective of the Special Issue, open to all researchers, is to
select outstanding contributions on recent advances in the combined
fields of pattern recognition and remote sensing.  The issue will be
focused on the use of pattern recognition methods in the analysis of
data collected from satellites or airborne sensors used for Earth
observation. All submitted papers will undergo a peer review process in
accordance with the requirements of the journal. Contributions are
encouraged from professionals in research, industrial, and academic
environments.

Prospective authors should follow the regular guidelines of the Pattern
Recognition Letters journal, and should submit their manuscripts
electronically to http://ees.elsevier.com/patrec.  Please indicate
during your submission that the paper is intended for this Special Issue
by selecting "Special Issue PRRS 2008" from the pull-down menu for
article type.

Guest Editors:
- Selim Aksoy, Bilkent University, Turkey (saksoy@cs.bilkent.edu.tr)
- Nicolas H. Younan, Mississippi State University, USA
(younan@ece.msstate.edu)
- Lorenzo Bruzzone, University of Trento, Italy (bruzzone@ing.unitn.it)

Please see **http://www.iapr-tc7.org/prrs08** for more details.

Best regards,

Selim

-- 
Selim Aksoy, Ph.D.
Assistant Professor               Phone: +90-312-2903405
Bilkent University                Fax:   +90-312-2664047
Dept. of Computer Engineering     Email: saksoy@cs.bilkent.edu.tr
Bilkent, 06800, Ankara, Turkey    http://www.cs.bilkent.edu.tr/~saksoy