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AISB event Bulletin Item

CFP: Wavelet Applications in Industrial Processing V (SA109)

*** Call for Papers and Announcement ***

Wavelet Applications in Industrial Processing V (SA109)
Part of SPIEs International Symposium on Optics East 2007
9-12 September 2007  Seaport World Trade Center  Boston, MA, USA

--- Abstract Due Date: 26 February 2007 ---
--- Manuscript Due Date: 13 August 2007 ---

Web site

Conference Chairs: Frdric Truchetet, Univ. de Bourgogne (France); Olivier Laligant, Univ. de Bourgogne (France)

Program Committee: Patrice Abry, cole Normale Suprieure de Lyon (France); Radu V. Balan, Siemens Corporate Research; Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia, Ecole Suprieure des Communications de Tunis (Tunisia); Albert Bijaoui, Observatoire de la Cte d'Azur (France); Seiji Hata, Kagawa Univ. (Japan); Henk J. A. M. Heijmans, Ctr. for Mathematics and Computer Science (Netherlands); William S. Hortos, Associates in Communication Engineering Research and Technology; Jacques Lewalle, Syracuse Univ.; Wilfried R. Philips, Univ. Gent (Belgium); Alexandra Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of Nottingham (United Kingdom); Hamed Sari-Sarraf, Texas Tech Univ.; Peter Schelkens, Vrije Univ. Brussel (Belgium); Paul Scheunders, Univ. Antwerpen (Belgium); Kenneth W. Tobin, Jr., Oak Ridge National Lab.; Gnther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald Zauner, Fachhochschule Wels (Austria)

The wavelet transform, multiresolution analysis, and other space-frequency or space-scale approaches are now considered standard tools by researchers in image and signal processing. Promising practical results in machine vision and sensors for industrial applications and non destructive testing have been obtained, and a lot of ideas can be applied to industrial imaging projects.
This conference is intended to bring together practitioners, researchers, and technologists in machine vision, sensors, non destructive testing, signal and image processing to share recent developments in wavelet and multiresolution approaches. Papers emphasizing fundamental methods that are widely applicable to industrial inspection and other industrial applications are especially welcome.

Papers are solicited but not limited to the following areas:

o New trends in wavelet and multiresolution approach, frame and overcomplete representations, Gabor transform, space-scale and space-frequency analysis, multiwavelets, directional wavelets, lifting scheme for:
- sensors
- signal and image denoising, enhancement, segmentation, image deblurring
- texture analysis
- pattern recognition
- shape recognition
- 3D surface analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic data analysis
- real-time implementation 
- image compression
- hardware, wavelet chips.

o Applications:
- machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision 
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- metrology
- real-time inspection. 

o Applications in microelectronics manufacturing, web and paper products, glass, plastic, steel, inspection, power production, chemical process, food and agriculture, pharmaceuticals, petroleum industry.
All submissions will be peer reviewed. Please note that abstracts must be at least 500 words in length in order to receive full consideration.

! Abstract Due Date: 26 February 2007   !
! Manuscript Due Date: 13 August 2007   !

------------- Submission of Abstracts for Optics East 2007 Symposium ------------
Abstract Due Date: 26 February 2007 - Manuscript Due Date: 13 August 2007
Abstracts, if accepted, will be distributed at the meeting.

- Submissions imply the intent of at least one author to register, attend the symposium, present the paper (either orally or in poster format), and submit a full-length manuscript for publication in the conference Proceedings.
- By submitting your abstract, you warrant that all clearances and permissions have been obtained, and authorize SPIE to circulate your abstract to conference committee members for review and selection purposes and if it is accepted, to publish your abstract in conference announcements and publicity.
- All authors (including invited or solicited speakers), program committee members, and session chairs are responsible for registering and paying the reduced author, session chair, program committee registration fee. (Current SPIE Members receive a discount on the registration fee.)

* Instructions for Submitting Abstracts via Web

- You are STRONGLY ENCOURAGED to submit abstracts using the submit an abstract link at:
- Submitting directly on the Web ensures that your abstract will be immediately accessible by the conference chair for review through MySPIE, SPIEs author/chair web site. 
- Please note! When submitting your abstract you must provide contact information for all authors, summarize your paper, and identify the contact author who will receive correspondence about the submission and who must submit the manuscript and all revisions. Please have this information available before you
begin the submission process.

- First-time users of MySPIE can create a new account by clicking on the create new account link. You can simplify account creation by using your SPIE ID# which is found on SPIE membership cards or the label of any SPIE mailing.

- If you do not have web access, you may E-MAIL each abstract separately to: in ASCII text (not encoded) format. There will be a time delay for abstracts submitted via e-mail as they will not be immediately processed for chair review.
IMPORTANT! To ensure proper processing of your abstract, the SUBJECT line must include only:

- Your abstract submission must include all of the following:
2. AUTHORS (principal author first) For each author: 
   o First (given) Name (initials not acceptable)
   o Last (family) Name
   o Affiliation
   o Mailing Address
   o Telephone Number
   o Fax Number
   o Email Address
3. PRESENTATION PREFERENCE "Oral Presentation" or "Poster Presentation." 
4. PRINCIPAL AUTHORS BIOGRAPHY Approximately 50 words.
5. ABSTRACT TEXT  Approximately 500 words.
   Accepted abstracts for this conference will be included in the abstract CD-ROM which will be available at the meeting. Please submit only 500-word abstracts that are suitable for publication.
6. KEYWORDS Maximum of five keywords.

If you do not have web access, you may E-MAIL each abstract separately to: in ASCII text (not encoded) format.  There will be a time delay for abstracts submitted via e-mail as they will not be immediately processed for chair review. 

* Conditions of Acceptance
- Authors are expected to secure funding for registration fees, travel, and accommodations, independent of SPIE, through their sponsoring organizations before submitting abstracts.

- Only original material should be submitted.

- Commercial papers, papers with no new research/development content, and papers where supporting data or a technical description cannot be given for proprietary reasons will not be accepted for presentation in this symposium.  

- Abstracts should contain enough detail to clearly convey the approach and the results of the research.

- Government and company clearance to present and publish should be final at the time of submittal. If you are a DoD contractor, allow at least 60 days for clearance. Authors are required to warrant to SPIE in advance of publication of the Proceedings that all necessary permissions and clearances have been obtained, and that submitting authors are authorized to transfer copyright of the paper to SPIE.

* Review, Notification, Program Placement

- To ensure a high-quality conference, all abstracts and Proceedings manuscripts will be reviewed by the Conference Chair/Editor for technical merit and suitability of content. Conference Chair/Editors may require manuscript revision before approving publication, and reserve the right to reject for presentation or publication any paper that does not meet content or presentation expectations. SPIEs decision on whether to accept a presentation or publish a manuscript is final.

- Applicants will be notified of abstract acceptance and sent manuscript instructions by e-mail no later than 7 May 2007. Notification of acceptance will be placed on SPIE Web the week of 4 June 2007 at

- Final placement in an oral or poster session is subject to the Chairs' discretion. Instructions for oral and poster presentations will be sent to you by e-mail. All oral and poster presentations require presentation at the meeting and submission of a manuscript to be included in the Proceedings of SPIE.

* Proceedings of SPIE

- These conferences will result in full-manuscript Chairs/Editor-reviewed volumes published in the Proceedings of SPIE and in the SPIE Digital Library.

- Correctly formatted, ready-to-print manuscripts submitted in English are required for all accepted oral and poster presentations. Electronic submissions are recommended, and result in higher quality reproduction. Submission must be provided in PostScript created with a printer driver compatible with SPIEs online Electronic Manuscript Submission system. Instructions are included in the author kit and from the Author Info link at the conference website.

- Authors are required to transfer copyright of the manuscript to SPIE or to provide a suitable publication license.

- Papers published are indexed in leading scientific databases including INSPEC, Ei Compendex, Chemical Abstracts, International Aerospace Abstracts, Index to Scientific and Technical Proceedings and NASA Astrophysical Data System, and are searchable in the SPIE Digital Library. Full manuscripts are available to Digital Library subscribers.

- Late manuscripts may not be published in the conference Proceedings and SPIE Digital Library, whether the conference volume will be published before or after the meeting. The objective of this policy is to better serve the conference participants as well as the technical community at large, by enabling timely publication of the Proceedings. 

- Papers not presented at the meeting will not be published in the
conference Proceedings, except in the case of exceptional circumstances at
the discretion of SPIE and the Conference Chairs/Editors.